Malvern Panalytical launches compact X-ray diffractometer

The device is hoped to enable smaller companies and educational institutions to contribute to research and process development

Malvern Panalytical has launched an updated version of its Aeris compact X-ray diffractometer (XRD). This version contains capabilities previously seen in the company’s larger systems. Building on the family of compact Aeris XRD systems which provide data from polycrystalline materials, this model is designed for use in all environments. Specifically, grazing-incidence XRD (GIXRD) will enable the examination of thin films and coatings, while transmission measurements will provide data unaffected by sample preparation artefacts.

The device’s operational interface is designed to simplify XRD measurements for the user. The performance of the Aeris is similar to floor standing systems, and it does not require any external supplies or infrastructure. It can also be used in a regulated environment with OmniTrust software.

Operators will still be able to switch between different applications, Malvern says, enabling them to concentrate on their research rather than on setting and aligning the system. The company hopes the affordability of the product will open possibilities for smaller companies in the pharmaceutical and coatings industries, as well as educational institutions, to contribute to scientific research and process development.

Wilijan Vissers, Product Manager Aeris: “I’m very proud that we’re launching our new Aeris – a model that continually raises the bar for powder XRD. By providing the data quality of a floor-standing system in a compact instrument, the new Aeris will enable a wider range of our customers to carry out in-depth materials analysis and optimize their processes – helping push the scientific frontier even further forward.”

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